مرکز منطقه ای اطلاع رساني علوم و فناوري - 21st IEEE International Conference on Microelectronic Test Structures

DocumentCode :

1072734

Title :

21st IEEE International Conference on Microelectronic Test Structures

Volume :

Issue :

fYear :

2007

Firstpage :

2067

Lastpage :

2067

Abstract :

Provides notice of upcoming conference events of interest to practitioners and researchers.

Keywords :

Object recognition;

fLanguage :

English

Journal_Title :

Electron Devices, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9383

Type :

jour

DOI :

10.1109/TED.2007.904372

Filename :

4277973

Link To Document :