DocumentCode
1072736
Title
Monte Carlo modeling of the transport of ionizing radiation created carriers in integrated circuits
Author
Sai-Halasz, G.A. ; Wordeman, M.R.
Author_Institution
IBM T.J. Watson Research Center, Yorktown Heights, New York
Volume
1
Issue
10
fYear
1980
fDate
10/1/1980 12:00:00 AM
Firstpage
211
Lastpage
213
Abstract
We are modeling the collection process of ionizing radiation created carriers. We assume that the charge collection problem can be reduced to the classical transport of minority carriers, and use the Monte Carlo method to solve the transport equation. This technique, with modest computational requirements, is capable of handling the realistic charge collection environments found in integrated circuits. To test the simulated results, we carried out charge collection experiments on simple layouts to α-particle radiation. Although a small deviation was found from the assumed classical transport, with a slight modification on the simulation this effect could be taken into account. The final agreement between theory and experiment is excellent.
Keywords
Circuit simulation; Circuit testing; Computational modeling; Equations; Error analysis; Geometry; Integrated circuit modeling; Ionizing radiation; Monte Carlo methods; Surface treatment;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1980.25292
Filename
1481154
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