• DocumentCode
    1072736
  • Title

    Monte Carlo modeling of the transport of ionizing radiation created carriers in integrated circuits

  • Author

    Sai-Halasz, G.A. ; Wordeman, M.R.

  • Author_Institution
    IBM T.J. Watson Research Center, Yorktown Heights, New York
  • Volume
    1
  • Issue
    10
  • fYear
    1980
  • fDate
    10/1/1980 12:00:00 AM
  • Firstpage
    211
  • Lastpage
    213
  • Abstract
    We are modeling the collection process of ionizing radiation created carriers. We assume that the charge collection problem can be reduced to the classical transport of minority carriers, and use the Monte Carlo method to solve the transport equation. This technique, with modest computational requirements, is capable of handling the realistic charge collection environments found in integrated circuits. To test the simulated results, we carried out charge collection experiments on simple layouts to α-particle radiation. Although a small deviation was found from the assumed classical transport, with a slight modification on the simulation this effect could be taken into account. The final agreement between theory and experiment is excellent.
  • Keywords
    Circuit simulation; Circuit testing; Computational modeling; Equations; Error analysis; Geometry; Integrated circuit modeling; Ionizing radiation; Monte Carlo methods; Surface treatment;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1980.25292
  • Filename
    1481154