DocumentCode :
1072736
Title :
Monte Carlo modeling of the transport of ionizing radiation created carriers in integrated circuits
Author :
Sai-Halasz, G.A. ; Wordeman, M.R.
Author_Institution :
IBM T.J. Watson Research Center, Yorktown Heights, New York
Volume :
1
Issue :
10
fYear :
1980
fDate :
10/1/1980 12:00:00 AM
Firstpage :
211
Lastpage :
213
Abstract :
We are modeling the collection process of ionizing radiation created carriers. We assume that the charge collection problem can be reduced to the classical transport of minority carriers, and use the Monte Carlo method to solve the transport equation. This technique, with modest computational requirements, is capable of handling the realistic charge collection environments found in integrated circuits. To test the simulated results, we carried out charge collection experiments on simple layouts to α-particle radiation. Although a small deviation was found from the assumed classical transport, with a slight modification on the simulation this effect could be taken into account. The final agreement between theory and experiment is excellent.
Keywords :
Circuit simulation; Circuit testing; Computational modeling; Equations; Error analysis; Geometry; Integrated circuit modeling; Ionizing radiation; Monte Carlo methods; Surface treatment;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1980.25292
Filename :
1481154
Link To Document :
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