DocumentCode
1072798
Title
A Fast Thresholded Landweber Algorithm for Wavelet-Regularized Multidimensional Deconvolution
Author
Vonesch, Cédric ; Unser, Michael
Author_Institution
EPFL, Lausanne
Volume
17
Issue
4
fYear
2008
fDate
4/1/2008 12:00:00 AM
Firstpage
539
Lastpage
549
Abstract
We present a fast variational deconvolution algorithm that minimizes a quadratic data term subject to a regularization on the -norm of the wavelet coefficients of the solution. Previously available methods have essentially consisted in alternating between a Landweber iteration and a wavelet-domain soft-thresholding operation. While having the advantage of simplicity, they are known to converge slowly. By expressing the cost functional in a Shannon wavelet basis, we are able to decompose the problem into a series of subband-dependent minimizations. In particular, this allows for larger (subband-dependent) step sizes and threshold levels than the previous method. This improves the convergence properties of the algorithm significantly. We demonstrate a speed-up of one order of magnitude in practical situations. This makes wavelet-regularized deconvolution more widely accessible, even for applications with a strong limitation on computational complexity. We present promising results in 3-D deconvolution microscopy, where the size of typical data sets does not permit more than a few tens of iterations.
Keywords
deconvolution; minimisation; fast thresholded landweber algorithm; subband-dependent minimizations; wavelet-regularized multidimensional deconvolution; 3-D; $ell^{1}$ -regularization; Deconvolution; fast; fluorescence microscopy; iterative; nonlinear; sparsity; thresholding; wavelets; Algorithms; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Microscopy, Fluorescence; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Time Factors;
fLanguage
English
Journal_Title
Image Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7149
Type
jour
DOI
10.1109/TIP.2008.917103
Filename
4454196
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