Analysis of Wear-Out Degradation of a DFB Laser Using an Optical-Beam-Induced Current Monitor

Author

Takeshita, Tatsuya ; Yamamoto, Mitsuo ; Iga, Ryuzo ; Sugo, Mitsuru ; Kondo, Yasuhiro ; Kato, Kazutoshi

Author_Institution

NTT Corp., Atsugi

Volume

54

Issue

8

fYear

2007

Firstpage

1852

Lastpage

1859

Abstract

We investigated the degradation behavior of distributed feedback lasers by employing the optical-beam-induced current measurement technique. We showed that the degradation mechanism is governed by diffused defects at the waveguide other than those in the vicinity of the antireflection facet. In addition, we found that a diffused source is probably generated in the upper InP cladding layer above the grating during the growth of the upper InP cladding layer.

Keywords

III-V semiconductors; OBIC; claddings; distributed feedback lasers; gallium arsenide; gallium compounds; indium compounds; optical waveguides; quantum well lasers; ruthenium; DFB laser; cladding layer; distributed feedback lasers; optical grating; optical waveguide; optical-beam-induced current measurement technique; optical-beam-induced current monitor; wear-out degradation; Current measurement; Degradation; Distributed feedback devices; Gratings; Indium phosphide; Laser feedback; Monitoring; Optical feedback; Optical waveguides; Waveguide lasers; Aging; distributed feedback (DFB) lasers; failure analysis; indium compounds; laser reliability; photon beams; quantum well lasers; ruthenium; semiconductor lasers;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2007.900975

Filename

4277984