• DocumentCode
    1072971
  • Title

    Investigation of the Impact of Power Granularity on Chip Thermal Modeling Using White Noise Analysis

  • Author

    Etessam-Yazdani, Keivan ; Asheghi, Mehdi ; Hamann, Hendrik F.

  • Author_Institution
    Alvand Technol., Inc., Santa Clara
  • Volume
    31
  • Issue
    1
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    211
  • Lastpage
    215
  • Abstract
    In this paper, we investigate the impact of the granularity of the power distribution for accurately predicting semiconductor chip temperature fields. Specifically, we calculate the transfer functions between power distributions and resulting temperature maps for various microprocessor packages and cooling conditions, which establish a minimum granularity required for accurate thermal analysis. The purpose of this paper is twofold: First, we like to provide some general guidelines for the impact of different power granularities on the global chip temperatures and second we intend to spike a broader discussion about to which extent small heating effects can affect chip temperatures for circuits under full operation. As such this work is not only beneficial for package and cooling solution engineering but is also important to circuit designers and computer architects in their battle against hotspots in microprocessors.
  • Keywords
    cooling; integrated circuit modelling; integrated circuit packaging; microprocessor chips; monolithic integrated circuits; power distribution; transfer functions; white noise; chip thermal modeling; cooling conditions; microprocessor packages; power distribution; power granularity; semiconductor chip temperature fields; transfer functions; white noise analysis; Fast Fourier transform (FFT); heat transfer; microprocessors; power granularity; power management; thermal management; white noise;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2008.916859
  • Filename
    4454212