Title :
Simultaneous optical label erasure and insertion in a single wavelength conversion stage of combined FSK/IM modulated signals
Author :
Olmos, J. J Vegas ; Zhang, J. ; Nielsen, P. V Holm ; Monroy, I. Tafur ; Polo, V. ; Koonen, A.M.J. ; Peucheret, C. ; Prat, J.
Author_Institution :
Fac. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
Abstract :
We report on optical label swapping of combined frequency-shift keying/intensity modulation (FSK/IM) modulated signals by using a single wavelength conversion stage based on a semiconductor optical amplifier Mach-Zehnder interferometer. Simultaneous FSK label erasure and insertion at a bit rate of 156 Mb/s is successfully achieved for a 10-Gb/s IM payload with transmission over two spans of 40-km standard single-mode fiber.
Keywords :
Mach-Zehnder interferometers; frequency shift keying; intensity modulation; multiprotocol label switching; optical wavelength conversion; semiconductor optical amplifiers; telecommunication network routing; EVI payload; Mach-Zehnder interferometer; combined FSK/IM modulated signals; frequency-shift keying; insertion; intensity modulation; optical label swapping; semiconductor optical amplifier; simultaneous optical label erasure; single wavelength conversion; Bit rate; Frequency shift keying; Intensity modulation; Multiprotocol label switching; Optical interferometry; Optical modulation; Optical wavelength conversion; Payloads; Semiconductor optical amplifiers; Stimulated emission;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.833084
