• DocumentCode
    1073592
  • Title

    Single-device-well MOSFET´s

  • Author

    Hamdy, Esmat Z. ; Elmasry, Mohamed I. ; El-Mansy, Youssef A.

  • Volume
    28
  • Issue
    3
  • fYear
    1981
  • fDate
    3/1/1981 12:00:00 AM
  • Firstpage
    322
  • Lastpage
    327
  • Abstract
    A novel MOSFET structure based on merging a surface enhancement-type device and a buried depletion-type device in a Single Device Well (SDW) is described. The SDW MOSFET structure utilizes the inherent two-dimensional geometry of a MOSFET device well to obtain two devices perpendicular to each other, having the same gate, thereby utilizing the hitherto nonutilized volume of the well. The two perpendicular currents of the devices in the merged structure are analyzed. An analytical model is developed and circuit CAD simulations are performed. A test chip is fabricated and the structure performance is evaluated. Some circuit examples are given.
  • Keywords
    Analytical models; CMOS technology; Geometry; Isolation technology; MOSFET circuits; Merging; Permittivity; Semiconductor impurities; Substrates; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20335
  • Filename
    1481487