• DocumentCode
    1073753
  • Title

    High-resolution ΔE measurements of Fe-Si-B amorphous wire

  • Author

    Atkinson, D. ; Squire, P.T. ; Gibbs, M.R.J. ; Yamasaki, J.

  • Author_Institution
    Sch. of Phys., Bath Univ., UK
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    3478
  • Lastpage
    3480
  • Abstract
    The field dependence of Young´s modulus, E(H), of as-cast Fe-based amorphous wire has been investigated using a high resolution vibrating reed system. The E(H) data have been combined with DC M(H) loops and Kerr effect surface domain images to provide information about the effect of the large Barkhausen jump which characterizes the magnetization reversal in this material. At low fields the modulus decreases via an abrupt small step which correlates with the field at which the large Barkhausen jump occurs in the M(H) behavior. It is suggested that the reversal of the magnetization in the core domain leads to a slight rearrangement of domains in the sheath region of the wires. This is supported by the surface domain images and indicates a small asymmetry in the remanence states
  • Keywords
    Barkhausen effect; Kerr magneto-optical effect; Young´s modulus; amorphous state; boron alloys; ferromagnetic properties of substances; iron alloys; magnetic domains; magnetic properties of amorphous substances; magnetisation reversal; magnetoelastic effects; remanence; silicon alloys; Barkhausen jump; Fe-Si-B amorphous wire; Kerr effect surface domain images; Young´s modulus; as-cast Fe-based amorphous wire; asymmetry; core domain; field dependence; high resolution vibrating reed system; magnetization reversal; rearrangement; remanence states; sheath region; Amorphous magnetic materials; Amorphous materials; Magnetic anisotropy; Magnetic cores; Magnetic domains; Magnetic field measurement; Magnetostatics; Magnetostriction; Perpendicular magnetic anisotropy; Wire;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.281202
  • Filename
    281202