DocumentCode :
1073906
Title :
Optical switching in thin film electroluminescent devices with inherent memory characteristics
Author :
Sahni, Omesh ; Howard, Webster E. ; Alt, Paul M.
Author_Institution :
IBM T.J. Watson Research Center, Yorktown Heights, NY
Volume :
28
Issue :
5
fYear :
1981
fDate :
5/1/1981 12:00:00 AM
Firstpage :
459
Lastpage :
465
Abstract :
Quantitative data is presented concerning the optical process of writing and erasing of memory electroluminescent (EL) devices. The switching process is dependent on the energy of the exciting photons and the energy required varies from approximately 10 µJ/cm2at 325 nm (associated with bandgap photoconductivity)to about 75 mJ/cm2at 515 nm (associated with impurity photoconductivity). Experimental evidence is presented to show that necessary and sufficient conditions for EL cell erasure are the photoconductive discharging of the insulator-ZnS charge and the decay of the bulk excitation of the ZnS:Mn film. The technique of photoinduced detrapping of the stored space charge is shown to lead to the determination of midgap as the approximate location in energy of the deep traps in one of our sample films.
Keywords :
Electroluminescent devices; Impurities; Insulation; Optical devices; Optical films; Photoconductivity; Photonic band gap; Sufficient conditions; Thin film devices; Writing;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20367
Filename :
1481519
Link To Document :
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