• DocumentCode
    1074353
  • Title

    Dynamic head characterization in the presence of reader nonlinear distortion

  • Author

    Chang, Thomas Y. ; Seagle, Dave ; Manickam, Malarvizhi

  • Author_Institution
    Seagate Technol., Bloomington, MN, USA
  • Volume
    40
  • Issue
    4
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    1963
  • Lastpage
    1968
  • Abstract
    Nonlinear response in magnetostrictive sensors significantly affects the spin-stand parametric measurements used to characterize writer and reader performance of recording heads. A simple production level test defined as the nonlinear distortion (NLD) ratio was used to quantify the degree of reader nonlinearity. A positive NLD value represents the presence of reader distortion while a value of zero represents no distortion. On a large population of heads tested, the median NLD value was 0.25, which is equivalent to an amplitude loss of 10% for an isolated pulse due to reader saturation. A detailed analysis of the measured data on nonlinear transition shift, partial erasure, and PW50 of these production heads show that greater than 50% of the measured variance is due to readback nonlinear distortion rather than true performance variation of the device.
  • Keywords
    giant magnetoresistance; harmonic analysis; magnetic heads; magnetic sensors; magnetostrictive devices; GMR heads; dynamic electrical test; harmonic analysis; head transfer curve characterization; isolated pulse; magnetostrictive sensors; nonlinear distortion ratio; nonlinear transition shift; partial erasure; readback nonlinear distortion; reader distortion; reader nonlinear distortion; reader nonlinearity; reader performance; reader saturation; recording head characterization; spin-stand parametric measurement; writer performance; Analysis of variance; Distortion measurement; Magnetic heads; Magnetic sensors; Magnetostriction; Nonlinear distortion; Production; Saturation magnetization; Sensor phenomena and characterization; Testing; Dynamic electrical test; GMR heads; NLD; NLTS; harmonic analysis; head transfer curve characterization; nonlinear transition shift; partial erasure; readback distortion; reader nonlinear distortion;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2003.821198
  • Filename
    1325369