DocumentCode :
1074456
Title :
Studies of temperature effects in AC thin-film EL devices
Author :
Yang, K.W. ; Owen, John S T ; Smith, David H.
Author_Institution :
Oregon State University, Corvallis, OR
Volume :
28
Issue :
6
fYear :
1981
fDate :
6/1/1981 12:00:00 AM
Firstpage :
703
Lastpage :
708
Abstract :
The effect of temperature variation of ZnS:Mn AC thin-film EL (ACTFEL device characteristics has been investigated. Systematic observations of electrical and optical properties are used to clarify some of the physical processes in these devices.
Keywords :
Brightness; Capacitors; Doping; Optical devices; Optical sensors; Stimulated emission; Temperature sensors; Thin film devices; Voltage; Zinc compounds;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20416
Filename :
1481568
Link To Document :
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