• DocumentCode
    1074474
  • Title

    Experimental observation of solute segregation in longitudinal CoPtCr/Cr magnetic thin films

  • Author

    Kim, Myong R. ; Guruswamy, Sivaraman ; Johnson, Kenneth E.

  • Author_Institution
    Dept. of Metall. Eng., Utah Univ., Salt Lake City, UT, USA
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    3673
  • Lastpage
    3675
  • Abstract
    The gain boundary structure and elemental segregation in longitudinal Co75Pt12Cr13/Cr magnetic thin film media were investigated by using high resolution transmission electron microscopy and nanoprobe X-ray chemical analysis. The study provides experimental evidence for the segregation of Cr and possibly Pt along the high-angle grain boundaries of Co-alloy grains. The maximum extents of Cr and Pt segregation are reported in terms of Cr/Co peak ratios measured at four grain interior locations and five grain boundary locations. The average Cr/Co peak ratios were 1.35±0.64 for the grain boundary and 0.51±0.16 for the grain interior. The average Pt/Co peak ratios were 1.10±0.22 for the grain boundary and 0.95±0.14 for the grain interior. As the extended excitation region and the electron beam broadening during transmission are larger than the boundary width, the actual segregation will be even higher than the values shown here
  • Keywords
    X-ray chemical analysis; chromium; chromium alloys; cobalt alloys; ferromagnetic properties of substances; grain boundaries; magnetic recording; magnetic thin films; platinum alloys; segregation; sputtered coatings; transmission electron microscope examination of materials; Co75Pt12Cr13-Cr magnetic thin film; electron beam broadening; elemental segregation; gain boundary structure; high resolution transmission electron microscopy; longitudinal thin films; magnetic recording; nanoprobe X-ray chemical analysis; solute segregation; sputter deposition; Chemical analysis; Chemical elements; Chromium; Grain boundaries; Magnetic films; Magnetic force microscopy; Magnetic noise; Magnetic separation; Sputtering; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.281265
  • Filename
    281265