DocumentCode
1074507
Title
RF planar ferromagnetic inductors on silicon
Author
Viala, B. ; Royet, A.S. ; Cuchet, R. ; Aïd, M. ; Gaud, P. ; Valls, O. ; Ledieu, M. ; Acher, O.
Author_Institution
Lab. d´´Electronique et Technol. de 1´´Inf., Comissariat a l´´Energie Atomique, Grenoble, France
Volume
40
Issue
4
fYear
2004
fDate
7/1/2004 12:00:00 AM
Firstpage
1999
Lastpage
2001
Abstract
Two-port coplanar ferromagnetic inductors using solid magnetic planes were fabricated on silicon. L, R, and Q measurements are presented. Cutoff frequencies exceed 10 GHz, indicating no capacitance limitation. The increase in L over the air-core value is ∼15%, and the quality factor Q is of ∼10 up to 1.5 GHz. The inductance scales with HA-alignment and spiral excitation ratio. Agreement with High-Frequency Structure Simulator simulations including ferromagnetic resonance led to a better understanding in terms of L and Q. Current increase in L is limited by the film thickness (0.2 μm). Thicker films (0.5-1 μm) would lead to larger gain over L (23% to 31%) with similar Q (∼10). The restriction in Q from the air-core inductor consists in magnetic losses but not only. Another contribution would come from anomalous ohmic losses from the spiral itself enhanced by the proximity of the magnetic planes.
Keywords
elemental semiconductors; ferromagnetic materials; ferromagnetic resonance; inductors; radiofrequency integrated circuits; silicon; HA-alignment; RF planar ferromagnetic inductors; air-core inductor; air-core value; capacitance limitation; coplanar ferromagnetic inductors; cutoff frequencies; ferromagnetic resonance; film thickness; inductance scales; magnetic losses; ohmic losses; quality factor; radio-frequency circuits; silicon; solid magnetic planes; spiral excitation ratio; Capacitance; Cutoff frequency; Inductors; Magnetic films; Q factor; Q measurement; Radio frequency; Silicon; Solids; Spirals; CoZrNb; RF; circuits; inductors; quality factor; radio-frequency;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2004.832486
Filename
1325385
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