DocumentCode :
1074563
Title :
Microstructural Evolution With the Change in Thickness of Superconducting Films
Author :
Jia, Q.X. ; Wang, H. ; Lin, Y. ; Li, Y. ; Wetteland, C. ; Brown, G.W. ; Hawley, M. ; Maiorov, B. ; Foltyn, S.R. ; Civale, L. ; Arendt, P.N. ; MacManus-Driscoll, J.L.
Author_Institution :
Los Alamos Nat. Lab., Los Alamos
Volume :
17
Issue :
2
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
3243
Lastpage :
3246
Abstract :
Microstructural evolution with the change in thickness of superconducting YBa2Cu3O7-X films on single-crystal SrTiO3 substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.
Keywords :
barium compounds; crystal microstructure; current density; high-temperature superconductors; pulsed laser deposition; superconducting thin films; yttrium compounds; SrTiO3 surface; YBa2Cu3O7; crystallinity; microstructural evolution; pulsed laser deposition; structural characterization; superconducting films; zero-field current-density; Crystal microstructure; Crystallization; High temperature superconductors; Magnetic films; Optical pulses; Pulsed laser deposition; Substrates; Superconducting films; X-ray diffraction; Yttrium barium copper oxide; Conductors; high-temperature superconductors; thick films; thin films;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2007.898941
Filename :
4278143
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1074563
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