Microstructural Evolution With the Change in Thickness of Superconducting Films

Author

Jia, Q.X. ; Wang, H. ; Lin, Y. ; Li, Y. ; Wetteland, C. ; Brown, G.W. ; Hawley, M. ; Maiorov, B. ; Foltyn, S.R. ; Civale, L. ; Arendt, P.N. ; MacManus-Driscoll, J.L.

Author_Institution

Los Alamos Nat. Lab., Los Alamos

Volume

17

Issue

2

fYear

2007

fDate

6/1/2007 12:00:00 AM

Firstpage

3243

Lastpage

3246

Abstract

Microstructural evolution with the change in thickness of superconducting YBa₂Cu₃O_7-X films on single-crystal SrTiO₃ substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.

Keywords

barium compounds; crystal microstructure; current density; high-temperature superconductors; pulsed laser deposition; superconducting thin films; yttrium compounds; SrTiO₃ surface; YBa₂Cu₃O₇; crystallinity; microstructural evolution; pulsed laser deposition; structural characterization; superconducting films; zero-field current-density; Crystal microstructure; Crystallization; High temperature superconductors; Magnetic films; Optical pulses; Pulsed laser deposition; Substrates; Superconducting films; X-ray diffraction; Yttrium barium copper oxide; Conductors; high-temperature superconductors; thick films; thin films;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2007.898941

Filename

4278143