• DocumentCode
    1074652
  • Title

    Fabrication of 45° mirrors together with well-defined v-grooves using wet anisotropic etching of silicon

  • Author

    Strandman, Carola ; Rosengren, Lars ; Elderstig, Håkan G A ; Bäcklund, Ylva

  • Author_Institution
    Dept. of Technol., Uppsala Univ., Sweden
  • Volume
    4
  • Issue
    4
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    213
  • Lastpage
    219
  • Abstract
    The most commonly used microstructure for passive fiber alignment is the ordinary v-groove, defined by {111} planes on a (100) silicon wafer. The plane at the end of the groove, having a 54.7° angle to the surface, can be used as a reflecting mirror. For single-mode fiber applications, a 45° mirror is advantageous together with high accuracy in the position of the fiber, i.e. a smooth mirror and good control of the groove geometry is needed. Two techniques are presented to form 45° mirrors along with well-defined grooves in silicon, using the wet anisotropic etchants EDP and KOH. These techniques are used: (1) to reveal {110} planes on (100) silicon and (2) to make {111} mirrors on wafers that are cut 9.7° off the [100] axis. On (100) silicon, EDP without pyrazine gave the best result. The best mirror and groove reproducibility was found on off-axis cut silicon, using 36 wt.% KOH, with isopropyl alcohol added
  • Keywords
    elemental semiconductors; etching; micromachining; mirrors; optical fabrication; optical fibre couplers; silicon; (100) Si wafer; 45° mirrors; EDP; KOH; Si; isopropyl alcohol; microstructure; mirror fabrication; passive fiber alignment; single-mode fiber applications; v-grooves; wet anisotropic etching; Anisotropic magnetoresistance; Fabrication; Fiber lasers; Mirrors; Optical fibers; Optical surface waves; Silicon; Surface emitting lasers; Vertical cavity surface emitting lasers; Wet etching;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.475548
  • Filename
    475548