• DocumentCode
    1074685
  • Title

    Interactions in CoPtCr/SiO2 composite thin films

  • Author

    El-Hilo, M. ; O´Grady, K. ; Nguyen, T.A. ; Baumgart, P. ; Sanders, I.L.

  • Author_Institution
    SEECS, Univ. Coll. of North Wales, Bangor, UK
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    3724
  • Lastpage
    3726
  • Abstract
    The behavior of CoPtCr/SiO2 composite thin films with variable percentages of SiO2 (0%→35%) is reported. From measurements of remanence curves and interaction characterization via the delta plot curves, films with 20%→24% SiO2 shows a wider range of switching fields and lower magnitude of interaction in comparison with the films containing a lower concentration of SiO2
  • Keywords
    chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic properties of substances; magnetic hysteresis; magnetic switching; magnetic thin films; platinum alloys; remanence; silicon compounds; sputtered coatings; CoPtCr-SiO2; CoPtCr/SiO2 composite thin films; coercivity; cooperative switching; delta plot curves; exchange coupled grains; interaction characterization; magnetic thin films; remanence curves; squareness co-sputtered; switching fields; Coercive force; Energy barrier; Magnetic separation; Magnetic susceptibility; Magnetization; Remanence; Shape; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.281282
  • Filename
    281282
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1074685