Thermal stability of bias point of packaged linear modulators in lithium niobate

Author

Greenblatt, Arthur S. ; Bulmer, Catherine H. ; Moeller, Robert P. ; Burns, William K.

Author_Institution

Naval Res. Lab., Washington, DC, USA

Volume

13

Issue

12

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

2314

Lastpage

2319

Abstract

The thermal stability of the bias point of packaged, passively biased, X-cut LiNbO₃ interferometric modulators is described. Absolute stability is assessed and a comparison is made of stability before and after laser ablation adjustment used to tune the bias point to linear operation (90° phase angle). Ablation is shown to be successful in setting the bias angle to ±1° of the desired value. The angle remained stable to a total variation of <5° over -25-+42°C both before and after ablation. All the observed angular changes with temperature were in the range 0.02-0.09 deg/°C. The effect of humidity in the package on modulator stability is characterized and then minimized for the actual devices

Keywords

Mach-Zehnder interferometers; absolute stability; electro-optical modulation; humidity; integrated optics; laser ablation; light interferometers; lithium compounds; packaging; thermal stability; -25 to 42 C; LiNbO₃; X-cut LiNbO₃ interferometric modulators; absolute stability; bias point; humidity; laser ablation adjustment; linear operation; lithium niobate; modulator stability; package; packaged linear modulators; passively biased; phase angle; thermal stability; total variation; tune; Capacitive sensors; Dielectric substrates; Electrodes; Humidity; Laser ablation; Laser stability; Laser tuning; Lithium niobate; Optical fiber polarization; Optical fibers; Optical waveguides; Packaging; Temperature; Temperature distribution; Thermal stability;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.475569

Filename

475569