Title :
Thermal stability of bias point of packaged linear modulators in lithium niobate
Author :
Greenblatt, Arthur S. ; Bulmer, Catherine H. ; Moeller, Robert P. ; Burns, William K.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fDate :
12/1/1995 12:00:00 AM
Abstract :
The thermal stability of the bias point of packaged, passively biased, X-cut LiNbO3 interferometric modulators is described. Absolute stability is assessed and a comparison is made of stability before and after laser ablation adjustment used to tune the bias point to linear operation (90° phase angle). Ablation is shown to be successful in setting the bias angle to ±1° of the desired value. The angle remained stable to a total variation of <5° over -25-+42°C both before and after ablation. All the observed angular changes with temperature were in the range 0.02-0.09 deg/°C. The effect of humidity in the package on modulator stability is characterized and then minimized for the actual devices
Keywords :
Mach-Zehnder interferometers; absolute stability; electro-optical modulation; humidity; integrated optics; laser ablation; light interferometers; lithium compounds; packaging; thermal stability; -25 to 42 C; LiNbO3; X-cut LiNbO3 interferometric modulators; absolute stability; bias point; humidity; laser ablation adjustment; linear operation; lithium niobate; modulator stability; package; packaged linear modulators; passively biased; phase angle; thermal stability; total variation; tune; Capacitive sensors; Dielectric substrates; Electrodes; Humidity; Laser ablation; Laser stability; Laser tuning; Lithium niobate; Optical fiber polarization; Optical fibers; Optical waveguides; Packaging; Temperature; Temperature distribution; Thermal stability;
Journal_Title :
Lightwave Technology, Journal of
