Title :
Distribution profile of magnetization in ME tape
Author :
Richter, Hans Jurgen ; Veitch, Ronald John ; Hibst, Hartmut ; Schildberg, Hans-Peter
Author_Institution :
BASF AG, Ludwigshafen, Germany
fDate :
11/1/1993 12:00:00 AM
Abstract :
Using partial erasure measurements, the depth up to which the head field is able to switch the magnetization in conventional particulate tapes can be determined. For metal evaporated tape, this experiment shows that the magnetization is not uniform throughout the magnetic layer. For a single layered metal evaporated tape with a total thickness of 200 nm, a layer with a thickness of about 55 nm near the top surface is estimated to have a magnetization 50% higher than the mean value
Keywords :
magnetic recording; magnetic tapes; magnetisation; remanence; magnetisation distribution profile; metal evaporated tape; partial erasure measurements; partial penetration recording; remanence; Current measurement; Digital magnetic recording; Magnetic field measurement; Magnetic flux; Magnetic heads; Magnetic recording; Magnetic switching; Saturation magnetization; Switches; Video recording;
Journal_Title :
Magnetics, IEEE Transactions on