• DocumentCode
    1074847
  • Title

    True direct overwrite in single layer magneto-optic recording

  • Author

    Schultz, Mark D. ; Kryder, Mark H. ; Sekiya, M. ; Chiba, K.

  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    3772
  • Lastpage
    3777
  • Abstract
    Single layer direct overwrite materials were investigated with the goal of improving the carrier-to-noise ratio (CNR) of these films. Both experimental and modeling studies of the dynamics of direct overwrite without defined bit positions were combined with the study of a large matrix of material samples to provide guided material improvements. Experimental study included magnetic measurements, CNR measurements, and observation of magnetization and thermal dynamics with stroboscopic polarized light microscopy. Thermal modeling was used to gain further insight into the thermal dynamics of direct overwrite. The results showed that flat substrates, high disc velocities, and materials which by means of sputter-etching the underlayer exhibit smooth wall motion can combine to produce true multifrequency direct overwrite with CNRs of 42 dB or better
  • Keywords
    magnetic domain walls; magnetisation; magneto-optical recording; noise; CNR; direct overwrite materials; dynamics of direct overwrite; flat substrates; high disc velocities; magnetization dynamics; modeling; single layer magneto-optic recording; smooth wall motion; sputter-etching; stroboscopic polarized light microscopy; thermal dynamics; true multifrequency direct overwrite; Data storage systems; Frequency; Magnetic field measurement; Magnetic force microscopy; Magnetic materials; Magnetization; Magnetooptic recording; Power lasers; Pulse measurements; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.281296
  • Filename
    281296