Multiresolution analysis for reconstruction of conductivity profiles in eddy current nondestructive evaluation using probe impedance data

Author

Shao, K.R. ; Guo, Youguang ; Lavers, J.D.

Author_Institution

Dept. of Electr. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China

Volume

40

Issue

4

fYear

2004

fDate

7/1/2004 12:00:00 AM

Firstpage

2101

Lastpage

2103

Abstract

This paper presents a wavelet-based multiresolution analysis method for solving the inverse problem in eddy current testing (ECT). Using the probe impedance signals as the measurement data, the reconstruction of conductivity profiles can be performed by a minimization scheme. The method allows to identify the regions where the perturbation may be localized and to retrieve the unknown parameters only in those regions. Some numerical simulation results show the feasibility of the technique.

Keywords

eddy current testing; electric impedance; inverse problems; minimisation; wavelet transforms; conductivity profile reconstruction; eddy current testing; inverse problem solving; minimization; multiresolution analysis; nondestructive evaluation; perturbation localization; probe impedance change; probe impedance data; probe impedance signals; wavelet based analysis; Conductivity measurement; Eddy current testing; Eddy currents; Electrical capacitance tomography; Impedance measurement; Inverse problems; Multiresolution analysis; Performance evaluation; Probes; Wavelet analysis; Eddy current testing; inverse problems; multiresolution analysis; probe impedance change;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2004.832264

Filename

1325419