• DocumentCode
    1074937
  • Title

    Monte Carlo estimation of hot carrier noise at millimeter- and submillimeter-wave frequencies

  • Author

    Grondin, Robert O. ; Blakey, Peter A. ; East, Jack R. ; Rothman, Edward D.

  • Author_Institution
    University of Michigan, Ann Arbor, MI
  • Volume
    28
  • Issue
    8
  • fYear
    1981
  • fDate
    8/1/1981 12:00:00 AM
  • Firstpage
    914
  • Lastpage
    923
  • Abstract
    This paper deals with the use of Monte Carlo experiments for investigating noise phenomena associated with hot carrier transport in semiconductors. In the first part of the paper procedures and problems associated with the design and interpretation of such experiments are discussed. The use of a Monte Carlo experiment is then demonstrated by estimating the velocity fluctuation spectrum of electrons in GaAs. Significant new results and insights are obtained. In particular, two new Spectral peaks are discovered and explained in terms of underlying physical processes, certain simple intuitive assumptions often made in noise theory are shown to be unjustified, and a criterion for the minimum flight time needed for estimates of "conventional" diffusion coefficients is obtained.
  • Keywords
    Electrons; Fluctuations; Frequency estimation; Gallium arsenide; Hot carriers; Microscopy; Monte Carlo methods; Noise shaping; Semiconductor device noise; Time series analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20459
  • Filename
    1481611