DocumentCode
1074937
Title
Monte Carlo estimation of hot carrier noise at millimeter- and submillimeter-wave frequencies
Author
Grondin, Robert O. ; Blakey, Peter A. ; East, Jack R. ; Rothman, Edward D.
Author_Institution
University of Michigan, Ann Arbor, MI
Volume
28
Issue
8
fYear
1981
fDate
8/1/1981 12:00:00 AM
Firstpage
914
Lastpage
923
Abstract
This paper deals with the use of Monte Carlo experiments for investigating noise phenomena associated with hot carrier transport in semiconductors. In the first part of the paper procedures and problems associated with the design and interpretation of such experiments are discussed. The use of a Monte Carlo experiment is then demonstrated by estimating the velocity fluctuation spectrum of electrons in GaAs. Significant new results and insights are obtained. In particular, two new Spectral peaks are discovered and explained in terms of underlying physical processes, certain simple intuitive assumptions often made in noise theory are shown to be unjustified, and a criterion for the minimum flight time needed for estimates of "conventional" diffusion coefficients is obtained.
Keywords
Electrons; Fluctuations; Frequency estimation; Gallium arsenide; Hot carriers; Microscopy; Monte Carlo methods; Noise shaping; Semiconductor device noise; Time series analysis;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20459
Filename
1481611
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