Dependence of Barkhausen noise on film parameters in shielded MR heads

Author

Ramesh, Mahadevan ; Dee, Richard H. ; Franzel, Kenneth S.

Author_Institution

Storage Technol. Corp., Louisville, CO, USA

Volume

29

Issue

6

fYear

1993

fDate

11/1/1993 12:00:00 AM

Firstpage

3817

Lastpage

3819

Abstract

Barkhausen discontinuities in read waveforms from shielded magnetoresistive (MR) heads have been isolated and analyzed using histograms and statistical methods. The data obtained have been found to be dependent on the test conditions and previous magnetic histories in addition to the magnetic properties of the element. For the heads studied, the Barkhausen noise is found to be affected primarily by easy axis misorientation, input flux excitation amplitude, element aspect ratio, and magnetic history and less so by magnetostriction coefficient

Keywords

Barkhausen effect; ferrite devices; magnetic heads; magnetic recording; magnetic thin film devices; magnetoresistive devices; magnetostriction; nickel compounds; noise; statistical analysis; zinc compounds; Barkhausen discontinuities; Barkhausen noise dependence; Ni_1-xZn_xFe₂O₄; NiZn ferrite; easy axis misorientation; element aspect ratio; film parameters; histograms; input flux excitation amplitude; magnetic histories; magnetostriction coefficient; read waveforms; shielded MR heads; shielded magnetoresistive head; statistical methods; Histograms; History; Magnetic analysis; Magnetic films; Magnetic flux; Magnetic heads; Magnetic noise; Magnetoresistance; Magnetostriction; Statistical analysis;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.281309

Filename

281309