Title :
Dependence of Barkhausen noise on film parameters in shielded MR heads
Author :
Ramesh, Mahadevan ; Dee, Richard H. ; Franzel, Kenneth S.
Author_Institution :
Storage Technol. Corp., Louisville, CO, USA
fDate :
11/1/1993 12:00:00 AM
Abstract :
Barkhausen discontinuities in read waveforms from shielded magnetoresistive (MR) heads have been isolated and analyzed using histograms and statistical methods. The data obtained have been found to be dependent on the test conditions and previous magnetic histories in addition to the magnetic properties of the element. For the heads studied, the Barkhausen noise is found to be affected primarily by easy axis misorientation, input flux excitation amplitude, element aspect ratio, and magnetic history and less so by magnetostriction coefficient
Keywords :
Barkhausen effect; ferrite devices; magnetic heads; magnetic recording; magnetic thin film devices; magnetoresistive devices; magnetostriction; nickel compounds; noise; statistical analysis; zinc compounds; Barkhausen discontinuities; Barkhausen noise dependence; Ni1-xZnxFe2O4; NiZn ferrite; easy axis misorientation; element aspect ratio; film parameters; histograms; input flux excitation amplitude; magnetic histories; magnetostriction coefficient; read waveforms; shielded MR heads; shielded magnetoresistive head; statistical methods; Histograms; History; Magnetic analysis; Magnetic films; Magnetic flux; Magnetic heads; Magnetic noise; Magnetoresistance; Magnetostriction; Statistical analysis;
Journal_Title :
Magnetics, IEEE Transactions on
