DocumentCode :
1075090
Title :
A study of Pd/Si MIS Schottky barrier diode hydrogen detector
Author :
Ruths, P.F. ; Ashok, S. ; Fonash, Stephen J. ; Rut, Joel M.
Author_Institution :
Western Electric Co., Allentown, PA
Volume :
28
Issue :
9
fYear :
1981
fDate :
9/1/1981 12:00:00 AM
Firstpage :
1003
Lastpage :
1009
Abstract :
Pd/Si MIS Schottky diode hydrogen detectors have been fabricated with a response of 2-3 orders of magnitude change in current for 154 ppm of H2in N2. Detailed evaluation of dark I-V, C-V, illuminated I-V, and internal photoemission data unambiguously ascribes the strong hydrogen sensitivity of these diodes to hydrogen-induced change in the work function of Pd, rather than to any surface-state effects. The reaction rate of the device to different gas ambients has been studied with time response measurements. A long-term degradation mechanism has been identified and traced to the poisoning of Pd by environmental sulfur. The role of oxygen and atomic hydrogen in determining the Schottky barrier height also is discussed in some detail.
Keywords :
Atomic measurements; Capacitance-voltage characteristics; Degradation; Detectors; Hydrogen; Photoelectricity; Schottky barriers; Schottky diodes; Time factors; Time measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20475
Filename :
1481627
Link To Document :
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