DocumentCode
1075090
Title
A study of Pd/Si MIS Schottky barrier diode hydrogen detector
Author
Ruths, P.F. ; Ashok, S. ; Fonash, Stephen J. ; Rut, Joel M.
Author_Institution
Western Electric Co., Allentown, PA
Volume
28
Issue
9
fYear
1981
fDate
9/1/1981 12:00:00 AM
Firstpage
1003
Lastpage
1009
Abstract
Pd/Si MIS Schottky diode hydrogen detectors have been fabricated with a response of 2-3 orders of magnitude change in current for 154 ppm of H2 in N2 . Detailed evaluation of dark I-V, C-V, illuminated I-V, and internal photoemission data unambiguously ascribes the strong hydrogen sensitivity of these diodes to hydrogen-induced change in the work function of Pd, rather than to any surface-state effects. The reaction rate of the device to different gas ambients has been studied with time response measurements. A long-term degradation mechanism has been identified and traced to the poisoning of Pd by environmental sulfur. The role of oxygen and atomic hydrogen in determining the Schottky barrier height also is discussed in some detail.
Keywords
Atomic measurements; Capacitance-voltage characteristics; Degradation; Detectors; Hydrogen; Photoelectricity; Schottky barriers; Schottky diodes; Time factors; Time measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20475
Filename
1481627
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