• DocumentCode
    1075090
  • Title

    A study of Pd/Si MIS Schottky barrier diode hydrogen detector

  • Author

    Ruths, P.F. ; Ashok, S. ; Fonash, Stephen J. ; Rut, Joel M.

  • Author_Institution
    Western Electric Co., Allentown, PA
  • Volume
    28
  • Issue
    9
  • fYear
    1981
  • fDate
    9/1/1981 12:00:00 AM
  • Firstpage
    1003
  • Lastpage
    1009
  • Abstract
    Pd/Si MIS Schottky diode hydrogen detectors have been fabricated with a response of 2-3 orders of magnitude change in current for 154 ppm of H2in N2. Detailed evaluation of dark I-V, C-V, illuminated I-V, and internal photoemission data unambiguously ascribes the strong hydrogen sensitivity of these diodes to hydrogen-induced change in the work function of Pd, rather than to any surface-state effects. The reaction rate of the device to different gas ambients has been studied with time response measurements. A long-term degradation mechanism has been identified and traced to the poisoning of Pd by environmental sulfur. The role of oxygen and atomic hydrogen in determining the Schottky barrier height also is discussed in some detail.
  • Keywords
    Atomic measurements; Capacitance-voltage characteristics; Degradation; Detectors; Hydrogen; Photoelectricity; Schottky barriers; Schottky diodes; Time factors; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20475
  • Filename
    1481627