• DocumentCode
    1075160
  • Title

    Detection of Hot Electron-Induced Radiation Damage in Organic Dielectrics by Exoelectron Emission from Thin Films

  • Author

    Cartier, E. ; Pfluger, P.

  • Author_Institution
    Brown Boveri Research Center Baden Switzerland
  • Issue
    2
  • fYear
    1987
  • fDate
    4/1/1987 12:00:00 AM
  • Firstpage
    123
  • Lastpage
    128
  • Abstract
    Charge trapping in thin dielectric films on metal substrates is investigated by thermally and optically stimulated exoelectron emission. The techniques are used to detect hot-electron-induced chemical degradation of hydrocarbon films. Radiation-induced electron traps are found if the films are irradiated with hot electrons above a threshold energy of 3.5 to 4 eV.
  • Keywords
    Charge carrier processes; Dielectric films; Dielectric substrates; Dielectric thin films; Electron optics; Electron traps; Gas detectors; Optical films; Radiation detectors; Stimulated emission;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1987.298868
  • Filename
    4081375
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1075160