The effects of the coupled slotline mode and air-bridges on CPW and NLC waveguide discontinuities

Author

Lee, Chung-Yi ; Liu, Yaozhong ; Itoh, Tatsuo

Author_Institution

Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA

Volume

43

Issue

12

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

2759

Lastpage

2765

Abstract

The extended spectral domain analysis is applied to analyze symmetrical and asymmetrical coplanar and non-leaky coplanar waveguide discontinuities. The three-dimensional dyadic Green´s function is derived first to calculate the contributions of horizontal (vertical) magnetic (electrical) currents. No air-bridges are needed if the discontinuity is symmetrical, It is shown that the coupled slotline (CSL) mode excited by asymmetrical discontinuities drastically affects the CPW circuit performance. The effect of air-bridges used to suppress the unwanted CSL mode is studied. Experimental data agree very well with numerical results for CPW discontinuities. In addition, the discontinuities of a novel conductor-backed CPW structure, the non-leaky coplanar (NLC) waveguide, are also investigated. From experiment, it is found that the SMA-to-NLC transition causes power leakage. Except for the small leakage, theoretical and experimental results agree well

Keywords

Green´s function methods; coplanar waveguides; spectral-domain analysis; waveguide discontinuities; waveguide theory; 3D dyadic Green function; CPW circuit performance; CPW discontinuities; NLC waveguide discontinuities; SMA-to-NLC transition; air-bridges; asymmetrical discontinuities; conductor-backed CPW structure; coupled slotline mode; extended spectral domain analysis; nonleaky coplanar waveguide discontinuities; power leakage; symmetrical discontinuities; Circuit optimization; Coplanar waveguides; Coupled mode analysis; Coupling circuits; Image analysis; Magnetic analysis; Magnetic domains; Slotline; Spectral analysis; Waveguide discontinuities;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.475632

Filename

475632