DocumentCode
1075266
Title
Kerr Electro-Optic Field Mapping Measurements in Electron Beam Irradiated Polymethylmethacrylate
Author
Zahn, M. ; Hikita, M. ; Wright, K.A. ; Cooke, C.M. ; Brennan, J.
Author_Institution
Massachusetts Institute of Technology Department of Electrical Engineering and Computer Science Laboratory for Electromagnetic and Electronic Systems High Voltage Research Laboratory Cambridge, MA
Issue
2
fYear
1987
fDate
4/1/1987 12:00:00 AM
Firstpage
181
Lastpage
185
Abstract
Kerr electro-optic field mapping measurements are presented in electron beam irradiated polymethylmethacrylate (PMMA) where the accumulated trapped charge results in large self-electric fields of the order of 1 to 2.5 MV/ cm. The resulting numerous light maximum and minimum recorded on photographic film and videotape allow accurate measurement of the time dependence of the electric field and space charge distributions.
Keywords
Charge measurement; Current measurement; Electric variables measurement; Electromagnetic measurements; Electron beams; Laboratories; Optical polarization; Photomultipliers; Voltage; Wavelength measurement;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/TEI.1987.298879
Filename
4081386
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