Stability analysis for large signal design of a microwave frequency doubler

Author

Basu, Saswata ; Maas, Stephen A. ; Itoh, Tatsuo

Author_Institution

Cascade Microtech Inc., Beaverton, OR, USA

Volume

43

Issue

12

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

2890

Lastpage

2898

Abstract

Microwave circuits such as frequency doublers are notorious for instabilities under parametric variation. The instabilities manifested in the doubler are due to the minority carrier lifetime of the pn junction diode. They are calculated using a simpler stability formulation. A global stability chart is computed using a novel technique called the piecewise stability analysis (PSA) method and found to be in close agreement with the experimental values. These instabilities are characterized by secondary Hopf bifurcations and their eventual breakdown to chaos has been observed. The onset of Hopf bifurcation has been verified both experimentally and numerically

Keywords

bifurcation; carrier lifetime; chaos; circuit stability; frequency multipliers; microwave circuits; microwave diodes; microwave frequency convertors; minority carriers; piecewise-linear techniques; chaos; global stability chart; large signal design; microwave frequency doubler; minority carrier lifetime; parametric variation instabilities; piecewise stability analysis; pn junction diode; secondary Hopf bifurcations; stability analysis; Bifurcation; Chaos; Charge carrier lifetime; Circuit stability; Diodes; Electric breakdown; Microwave circuits; Microwave frequencies; Signal design; Stability analysis;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.475651

Filename

475651