• DocumentCode
    1075424
  • Title

    Waveform-based modeling and characterization of microwave power heterojunction bipolar transistors

  • Author

    Wei, Ce-Jun ; Lan, Y. Ellen ; Hwang, C. M James ; Ho, Wu-Jing ; HigginS, J. Aiden

  • Author_Institution
    Lehigh Univ., Bethlehem, PA, USA
  • Volume
    43
  • Issue
    12
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    2899
  • Lastpage
    2903
  • Abstract
    A waveform measurement technique has been successfully used to extract the large-signal nonlinear characteristics of microwave power heterojunction bipolar transistors. The extracted model parameters were compared to those extracted from dc and small-signal parameters in a conventional manner. It was found that, for high input drive conditions, the present model predicts a much longer collector transit time than the conventional model. Therefore, the present model is more consistent with the physical structure of the transistors and more suitable for evaluating future design improvement
  • Keywords
    heterojunction bipolar transistors; microwave bipolar transistors; microwave power transistors; power bipolar transistors; semiconductor device models; waveform analysis; collector transit time; large-signal nonlinear characteristics; microwave power heterojunction bipolar transistors; waveform-based modeling; Couplers; Current measurement; Data mining; Heterojunction bipolar transistors; Microwave theory and techniques; Microwave transistors; Predictive models; Probes; Scattering parameters; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.475652
  • Filename
    475652