Title :
Investigation on tape-head contact in VTR
Author :
Okuwaki, T. ; Kawakita, T. ; Akahane, N. ; Kusumoto, K.
Author_Institution :
Hitachi Maxell, Ltd., Kyoto, Japan
fDate :
11/1/1993 12:00:00 AM
Abstract :
Describes the tape-head contact, especially the spacing between the tape and the head in video tape recorders (VTRs), from the viewpoint of tape surface roughness. The spacing was measured by the optical interference method, and the surface roughness by an optical noncontact microsurface measurement system. The spacing, obtained by the phase-shift correction of the reflected light, is found to be equal to the surface roughness P-O (peak to O level) value of the tape. This assures that the output voltage of metal evaporated (ME) tape is larger than that of metal powder (MP) tape by only about +2 dB at the wavelength w=0.49 μm except for the spacing effect caused by the tape surface roughness
Keywords :
light interferometry; magnetic heads; surface topography measurement; video tape recorders; VTR; metal evaporated tape; metal powder tape; optical interference method; optical noncontact microsurface measurement system; output voltage; phase-shift correction; tape surface roughness; tape-head contact; Interference; Magnetic heads; Optical recording; Optical surface waves; Powders; Rough surfaces; Surface roughness; Surface waves; Video recording; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on