Title :
Internal-node waveform analysis of MMIC power amplifiers
Author :
Wei, Ce-Jun ; Tkachenko, Yevgeniy A. ; Hwang, James C M ; Smith, Kenneth R. ; Peake, Andrew H.
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
fDate :
12/1/1995 12:00:00 AM
Abstract :
A novel internal-node waveform probing technique has been demonstrated on a C-band monolithic microwave integrated circuit (MMIC) power amplifier. The error of the measurement and its perturbance to circuit operation was estimated and verified to be within ±10%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location. The potential impact of this technique includes MMIC design verification, in-situ device model extraction, process diagnosis, and reliability assessment
Keywords :
MMIC power amplifiers; integrated circuit testing; measurement errors; microwave measurement; probes; waveform analysis; C-band; MMIC power amplifiers; design verification; in-situ device model extraction; internal-node waveform probing technique; monolithic microwave integrated circuit; process diagnosis; reliability assessment; Impedance; MMICs; Microwave amplifiers; Microwave theory and techniques; Power amplifiers; Power transmission lines; Probes; Resistors; Sampling methods; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
