DocumentCode :
1075744
Title :
Speckle metrology
Author :
Vest, C.
Author_Institution :
University of Michigan, Ann Arbor, MI, USA
Volume :
15
Issue :
12
fYear :
1979
fDate :
12/1/1979 12:00:00 AM
Firstpage :
1438
Lastpage :
1438
Keywords :
Book reviews; Laser radiation effects; Optical scattering; Books; Holography; Metrology; Optical interferometry; Optical scattering; Rough surfaces; Speckle; Strain measurement; Surface roughness; Vibration measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1979.1069956
Filename :
1069956
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1075744
