• DocumentCode
    107578
  • Title

    Silicon-Controlled Rectifier for Electrostatic Discharge Protection Solutions With Minimal Snapback and Reduced Overshoot Voltage

  • Author

    Ruei-Cheng Sun ; Zhixin Wang ; Klebanov, Maxim ; Wei Liang ; Liou, Juin J. ; Don-Gey Liu

  • Author_Institution
    Ph.D. Program of Electr. & Commun. Eng., Feng Chia Univ., Taichung, Taiwan
  • Volume
    36
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    424
  • Lastpage
    426
  • Abstract
    An electrostatic discharge (ESD) protection structure constructed by the stacking of multiple anode gate-cathode gate directly connected silicon-controlled rectifiers (DCSCRs), fabricated in a 0.18-μm CMOS technology is reported in this letter. Two embedded diodes in the DCSCR dictate the turn-ON mechanism and hence give rise to a trigger voltage equal to twice the diode´s turn-ON voltage. This approach enables the DCSCR to offer a diode-like transmission line pulsing IV characteristic with a minimal snapback and a SCR-like high-ESD robustness. At 25 °C, DCSCR has an acceptable nanoampere-level leakage current. Besides, it is verified that the DCSCR can significantly reduce overshoot voltage when stressed by very-fast-rising pulses. As such, an ESD clamp constructed by stacking a selected number of DCSCRs can offer a flexible trigger/holding voltage and is suitable for low and medium voltage ESD protection applications.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; leakage currents; protection; thyristors; CMOS; Si; diode-like transmission line pulsing IV characteristic; electrostatic discharge protection solutions; embedded diodes; minimal snapback; multiple anode gate; nanoampere-level leakage current; reduced overshoot voltage; silicon-controlled rectifier; size 0.18 mum; temperature 25 degC; trigger voltage; turn-ON mechanism; turn-ON voltage; CMOS integrated circuits; Electrostatic discharges; Leakage currents; Logic gates; Stacking; Thyristors; Transmission line measurements; ESD; SCR; direct-connected; overshoot; stacking;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2413844
  • Filename
    7063252