Crystal orientation of Mn-Ir antiferromagnetic films for exchange-biased soft-magnetic underlayer in perpendicular recording media

Author

Suzuki, Toshio ; Ouchi, Kazuhiro

Author_Institution

Akita Res. Inst. of Adv. Technol., Japan

Volume

40

Issue

4

fYear

2004

fDate

7/1/2004 12:00:00 AM

Firstpage

2347

Lastpage

2349

Abstract

Three kinds of crystal orientations for Mn-Ir antiferromagnetic films were successfully obtained on the glass disk substrates. Mn-Ir(111) film was prepared on an underlayer of Nb-Permalloy/Ta/glass-disk. Mn-Ir(001) film was obtained on MgO/glass-disk. On the other hand, Nb-Permalloy was found to exhibit [110] orientation at sputtering temperatures between 200°C and 400°C on the MgO layer, thus Mn-Ir(110) was first realized on the underlayer of Nb-Permalloy/MgO/glass-disk. The exchange-bias fields, H_ex, and possibility of increasing the H_ex were investigated.

Keywords

Permalloy; antiferromagnetic materials; crystal orientation; exchange interactions (electron); manganese alloys; perpendicular magnetic recording; soft magnetic materials; sputter deposition; 200 to 400 C; MnIr-MgO; Nb-Permalloy; antiferromagnetic films; crystal orientation; exchange-bias fields; exchange-biased soft-magnetic underlayer; glass disk substrates; perpendicular recording media; Amorphous materials; Antiferromagnetic materials; Crystallization; Glass; Magnetic films; Perpendicular magnetic recording; Sputtering; Substrates; Temperature; X-ray scattering; Crystal orientation; MgO; MnIr; exchange bias; permalloy; perpendicular magnetic recording;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2004.830418

Filename

1325500