DocumentCode

1075937

Title

IVB-3 Fowler-Nordheim tunneling in MIS structures

Author

Krieger, Gerhard ; Swanson, Richard M.

Volume

28

Issue

10

fYear

1981

fDate

10/1/1981 12:00:00 AM

Firstpage

1237

Lastpage

1238

Keywords

Breakdown voltage; Capacitors; Charge coupled devices; Current measurement; Electrons; Laboratories; Nonvolatile memory; Silicon; Tunneling; Writing;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1981.20560

Filename

1481712