Title :
Exchange bias enhancement through interdiffusion of NiFe/FeMn/metal films
Author :
Chen, Mao-Min ; Tsang, Ching ; Gharsallah, N.
Author_Institution :
IBM AdStar, San Jose, CA, USA
fDate :
11/1/1993 12:00:00 AM
Abstract :
The exchange bias field of the NiFe/FeMn system was found to increase from 30-35 Oe up to 75 Oe by annealing a three layer film structure of NiFe(300 Å)/FeMn/M (M=Au,Rh,Pt,Cr,Cu, etc.) at elevated temperature. Auger electron spectroscopy shows that interdiffusion occurred in the multilayer structure between the FeMn and the metal layer. The increase in exchange bias field is attributed to the altered interface of NiFe/FeMn due to the interdiffusion
Keywords :
Auger effect; annealing; chemical interdiffusion; exchange interactions (electron); ferromagnetic properties of substances; iron alloys; magnetic multilayers; manganese alloys; nickel alloys; sputtered coatings; 240 C; 300 angstroms; Auger electron spectroscopy; NiFe-FeMn; RF diode sputtering system; annealing; exchange bias field; interdiffusion; multilayer film; multilayer structure; Anisotropic magnetoresistance; Annealing; Antiferromagnetic materials; Chromium; Glass; Gold; Magnetic films; Nonhomogeneous media; Sputtering; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
