Title :
Recording characteristics at a channel rate over 300 mb/s in a helical-scan tape system
Author :
Suzuki, K. ; Shirai, T. ; Watanabe, T. ; Mikami, Y. ; Fukuda, S. ; Ozue, T.
Author_Institution :
Yokohama Res. Center, Sony Corp. Micro Syst. Network Co., Yokohama, Japan
fDate :
7/1/2004 12:00:00 AM
Abstract :
Recording characteristics at high-linear density were investigated using a spin-stand tape tester. Low-noise metal obliquely evaporated tape with a 40-nm magnetic layer was used. Read signal level and nonlinear transition shift of a thin-film head was compared with that of a metal-in-gap head. A prototype helical-scan tape drive with a thin-film head and a giant magnetoresistive head was developed to investigate the recording characteristics at channel rates over 300 Mb/s. A sufficient signal-to-noise ratio of 18 dB was obtained at a channel rate of 300 Mb/s with a read track width of 0.8 μm and a linear density of 376 kFRPI.
Keywords :
giant magnetoresistance; magnetic heads; magnetic tapes; magnetic thin films; spin systems; 0.8 micron; 18 dB; 300 Mbit/s; 40 nm; channel rate; giant magnetoresistive head; helical-scan tape system; high-linear density; low-noise metal; magnetic layer; metal obliquely evaporated tape; metal-in-gap head; nonlinear transition shift; read signal level; recording characteristics; signal-to-noise ratio; spin-stand tape tester; thin-film head; Anisotropic magnetoresistance; Frequency dependence; Giant magnetoresistance; Magnetic anisotropy; Magnetic heads; Magnetic recording; Perpendicular magnetic anisotropy; Prototypes; System testing; Transistors; GMR; Giant magnetoresistive; ME; head; helical-scan tape system; metal obliquely evaporated; tape; thin-film head;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.829186
