Title :
Nonlinear Magnetic Diffusion in a Bi2212 Hollow Cylinder: Measurements and Numerical Simulations
Author :
Sirois, Frédéric ; Cave, Julian R. ; Basile-Bellavance, Yan
Author_Institution :
Ecole Polytech. de Montreal, Montreal
fDate :
6/1/2007 12:00:00 AM
Abstract :
This paper compares numerical simulations and measurements of the nonlinear magnetic diffusion phenomenon in a Bi2212 high temperature superconducting (HTS) hollow cylinder. Although the measurements were done many years ago, it is only recently that computer power has become sufficient to reproduce the experiment by simulation on a personal computer in a reasonable time. Observations of flux density (magnitude and phase) both inside and outside the cylinder were carried out at different frequencies and magnitudes of a sinusoidal applied field. In addition, the computed current and flux density profiles inside the superconductor were obtained. The superconductor was modeled by E - J characteristics that depend on Jc and a power law exponent n. Both parameters are isotropic functions of B. The paper shows that numerical methods are useful to extract model parameters and to predict the behavior of HTS elements entering in the conception of real applications, such as the inductive fault current limiters.
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; magnetic flux; strontium compounds; Bi2Sr2CaCu2O8; current density; flux density; high temperature superconducting hollow cylinder; isotropic functions; model parameters; nonlinear magnetic diffusion; numerical simulations; power law exponent; sinusoidal applied field; Computational modeling; Computer simulation; Frequency; High temperature superconductors; Microcomputers; Nonlinear magnetics; Numerical simulation; Power measurement; Predictive models; Time measurement; Diffusion processes; fault current limiters; high-temperature superconductors; magnetic field measurement; numerical analysis;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.900002