Title :
VIB-2 theory of electron heating and programming in FAMOS devices
fDate :
10/1/1981 12:00:00 AM
Keywords :
Boltzmann equation; Channel bank filters; Current measurement; Heating; Low voltage; Probability distribution; Solids; Substrate hot electron injection; Temperature distribution; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1981.20589
