DocumentCode
1076257
Title
VIB-3 correlation between substrate and gate currents in MOSFETs
Author
Ko, P.K. ; Hu, Chuanmin ; Muller, R.S.
Volume
28
Issue
10
fYear
1981
fDate
10/1/1981 12:00:00 AM
Firstpage
1260
Lastpage
1261
Keywords
Current measurement; Integral equations; Laboratories; Length measurement; MOSFETs; Performance evaluation; Poisson equations; Reliability theory; Secondary generated hot electron injection; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20591
Filename
1481743
Link To Document