DocumentCode :
1076331
Title :
Visual Servo Control Achieving Nanometer Resolution in X Y
Author :
Kim, Jung H. ; Menq, Chia-Hsiang
Author_Institution :
Lam Res. Corp., Fremont, CA
Volume :
25
Issue :
1
fYear :
2009
Firstpage :
109
Lastpage :
116
Abstract :
This paper presents a three-axis vision motion sensor and its applications to visual servo control. The vision sensor is integrated with a three-axis piezo stage to form a visual servo control system that achieves nanometer resolution in all three x- y-z motion axes. Motion measurement is achieved using a single interferometer-equipped optical microscope. A real-time image-processing algorithm that processes interference fringe patterns and that achieves nanometer out-of-plane resolution is presented. Furthermore, a feedback-control scheme is introduced to control the sensor plane using an Objective-Z-Positioner to enable automatic tracking of moving objects. It expands the out-of-plane measurement range of the vision sensor beyond its inherent depth of field of several micrometers to 100 mum and beyond. An integrated visual servo system is implemented and experimental results are shown.
Keywords :
feedback; interferometers; motion control; motion measurement; optical microscopes; position control; servomechanisms; Objective-Z-Positioner; feedback-control scheme; interferometer-equipped optical microscope; motion measurement; nanometer resolution; three-axis vision motion sensor; visual servo control; Fringe pattern; interferometry; laterally sampled white light interferometry (L-SWLI); motion measurement; optical microscope; visual servo control; white light interferometry (WLI);
fLanguage :
English
Journal_Title :
Robotics, IEEE Transactions on
Publisher :
ieee
ISSN :
1552-3098
Type :
jour
DOI :
10.1109/TRO.2008.2003267
Filename :
4757222
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