DocumentCode :
1076356
Title :
Numerical Simulation of Permanent Magnet Method: Relation Between Critical Current Density and Maximum Repulsive Force
Author :
Takayama, Teruou ; Kamitani, Atsushi ; Ohshima, Shigetoshi ; Saito, Atsushi
Author_Institution :
Yamagata Univ., Yamagata
Volume :
17
Issue :
2
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
3745
Lastpage :
3748
Abstract :
The permanent magnet method for measuring the critical current density of the high-temperature superconducting (HTS) thin film is investigated numerically. The numerical code has been developed for analyzing the time evolution of the shielding current density in the HTS thin film. In the code, the initial-boundary-value problem of the shielding current density is solved numerically. After discretized by using the finite element method (FEM) and the backward Euler method, it is reduced to the problem in which the simultaneous nonlinear equations are solved at each time step. By using the numerical code, the maximum repulsive force is calculated as a function of the critical current density. The results of computations show an excellent proportional relationship between them. This is mainly because the spatial distribution of the shielding current density varies in proportion to the critical current density except for the neighborhood of the film edge.
Keywords :
boundary-value problems; critical current density (superconductivity); finite element analysis; high-temperature superconductors; superconducting thin films; FEM; backward Euler method; boundary value problem; critical current density; finite element method; high temperature superconducting thin film; maximum repulsive force; permanent magnet method; shielding current density; Critical current density; Current density; Current measurement; Density measurement; High temperature superconductors; Magnetic analysis; Numerical simulation; Permanent magnets; Superconducting magnets; Superconducting thin films; Critical current density; high-temperature superconductors; numerical analysis; thin films;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2007.899409
Filename :
4278299
Link To Document :
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