• DocumentCode
    1076356
  • Title

    Numerical Simulation of Permanent Magnet Method: Relation Between Critical Current Density and Maximum Repulsive Force

  • Author

    Takayama, Teruou ; Kamitani, Atsushi ; Ohshima, Shigetoshi ; Saito, Atsushi

  • Author_Institution
    Yamagata Univ., Yamagata
  • Volume
    17
  • Issue
    2
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    3745
  • Lastpage
    3748
  • Abstract
    The permanent magnet method for measuring the critical current density of the high-temperature superconducting (HTS) thin film is investigated numerically. The numerical code has been developed for analyzing the time evolution of the shielding current density in the HTS thin film. In the code, the initial-boundary-value problem of the shielding current density is solved numerically. After discretized by using the finite element method (FEM) and the backward Euler method, it is reduced to the problem in which the simultaneous nonlinear equations are solved at each time step. By using the numerical code, the maximum repulsive force is calculated as a function of the critical current density. The results of computations show an excellent proportional relationship between them. This is mainly because the spatial distribution of the shielding current density varies in proportion to the critical current density except for the neighborhood of the film edge.
  • Keywords
    boundary-value problems; critical current density (superconductivity); finite element analysis; high-temperature superconductors; superconducting thin films; FEM; backward Euler method; boundary value problem; critical current density; finite element method; high temperature superconducting thin film; maximum repulsive force; permanent magnet method; shielding current density; Critical current density; Current density; Current measurement; Density measurement; High temperature superconductors; Magnetic analysis; Numerical simulation; Permanent magnets; Superconducting magnets; Superconducting thin films; Critical current density; high-temperature superconductors; numerical analysis; thin films;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2007.899409
  • Filename
    4278299