• DocumentCode
    1076402
  • Title

    Temperature dependence of the electrical resistivity in some amorphous ferromagnetic alloys

  • Author

    Dolocan, Voicu ; Dolocan, Elena

  • Author_Institution
    Fac. of Phys., Bucharest Univ., Romania
  • Volume
    24
  • Issue
    2
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    1832
  • Lastpage
    1834
  • Abstract
    Temperature coefficient of the resistivity and crystallization are studied in Fe100-xBx, Fe80-xCoxB20, Fe78B22-xSix and Fe100-xBx-ySiy amorphous alloys. From the comparison of the theory with experimental data, the structure factors for these alloys were evaluated. The sharp drop of the resistivity at crystallization temperature increases with Fe content and decreases with Si content. During the measurements the Debye temperature could vary for a given sample. This variation is considered to be produced by changes in microstructure of the amorphous sample which are induced by thermal activation during thermal treatments. An irreversible change of the short-range order is attained which is related to an irreversible decrease of the free volume. Simultaneously, a reversible modification of this order is interpreted as due to reorientation of atomic chemical bonds.
  • Keywords
    Debye temperature; boron alloys; cobalt alloys; crystallisation; electrical conductivity of amorphous metals and alloys; ferromagnetic properties of substances; iron alloys; magnetic properties of amorphous substances; silicon alloys; Debye temperature; Fe100-xBx-ySiy; Fe100-xBx; Fe78B22-xSix; Fe80-xCoxB20; amorphous ferromagnetic alloys; atomic chemical bonds; crystallization temperature; electrical resistivity; microstructure; short-range order; thermal activation; thermal treatments; Amorphous materials; Amorphous semiconductors; Cobalt alloys; Conductivity; Crystallization; Electric resistance; Iron alloys; Silicon alloys; Temperature dependence; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.11617
  • Filename
    11617