• DocumentCode
    1076427
  • Title

    Reactive ion etching for VLSI

  • Author

    Ephrath, Linda M.

  • Author_Institution
    IBM Thomas J. Watson Research Center, Yorktown Heights, NY
  • Volume
    28
  • Issue
    11
  • fYear
    1981
  • fDate
    11/1/1981 12:00:00 AM
  • Firstpage
    1315
  • Lastpage
    1319
  • Abstract
    Reactive Ion Etching (RIE) is a dry etching technique that is used to etch 1-µm and submicrometer patterns into films of silicon and silicon compounds. RIE is suitable for VLSI applications because etching is anisotropic and proceeds via chemical reactions with the substrate. Anisotropic etching allows faithful reproduction of resist patterns into the films that make up a device, and chemical etching allows development of selective etching by manipulating the composition of the plasma. The RIE reactor is described and examples of its use to fabricate 1-µm MOSFET´s are given. Concerns arising from the presence of a voltage between the substrates and the plasma, radiation damage of SiO2and contamination of silicon, are discussed.
  • Keywords
    Anisotropic magnetoresistance; Chemicals; Dry etching; Plasma applications; Plasma chemistry; Plasma devices; Resists; Semiconductor films; Silicon compounds; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20607
  • Filename
    1481759