DocumentCode
1076427
Title
Reactive ion etching for VLSI
Author
Ephrath, Linda M.
Author_Institution
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume
28
Issue
11
fYear
1981
fDate
11/1/1981 12:00:00 AM
Firstpage
1315
Lastpage
1319
Abstract
Reactive Ion Etching (RIE) is a dry etching technique that is used to etch 1-µm and submicrometer patterns into films of silicon and silicon compounds. RIE is suitable for VLSI applications because etching is anisotropic and proceeds via chemical reactions with the substrate. Anisotropic etching allows faithful reproduction of resist patterns into the films that make up a device, and chemical etching allows development of selective etching by manipulating the composition of the plasma. The RIE reactor is described and examples of its use to fabricate 1-µm MOSFET´s are given. Concerns arising from the presence of a voltage between the substrates and the plasma, radiation damage of SiO2 and contamination of silicon, are discussed.
Keywords
Anisotropic magnetoresistance; Chemicals; Dry etching; Plasma applications; Plasma chemistry; Plasma devices; Resists; Semiconductor films; Silicon compounds; Very large scale integration;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20607
Filename
1481759
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