DocumentCode :
1076427
Title :
Reactive ion etching for VLSI
Author :
Ephrath, Linda M.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume :
28
Issue :
11
fYear :
1981
fDate :
11/1/1981 12:00:00 AM
Firstpage :
1315
Lastpage :
1319
Abstract :
Reactive Ion Etching (RIE) is a dry etching technique that is used to etch 1-µm and submicrometer patterns into films of silicon and silicon compounds. RIE is suitable for VLSI applications because etching is anisotropic and proceeds via chemical reactions with the substrate. Anisotropic etching allows faithful reproduction of resist patterns into the films that make up a device, and chemical etching allows development of selective etching by manipulating the composition of the plasma. The RIE reactor is described and examples of its use to fabricate 1-µm MOSFET´s are given. Concerns arising from the presence of a voltage between the substrates and the plasma, radiation damage of SiO2and contamination of silicon, are discussed.
Keywords :
Anisotropic magnetoresistance; Chemicals; Dry etching; Plasma applications; Plasma chemistry; Plasma devices; Resists; Semiconductor films; Silicon compounds; Very large scale integration;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20607
Filename :
1481759
Link To Document :
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