DocumentCode
1076552
Title
A model for mark size dependence on field emission voltage in heat-assisted magnetic probe recording on CoNi/Pt multilayers
Author
Zhang, Li ; Bain, James A. ; Zhu, Jian-Gang ; Abelmann, Leon ; Onoue, Takahiro
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
40
Issue
4
fYear
2004
fDate
7/1/2004 12:00:00 AM
Firstpage
2549
Lastpage
2551
Abstract
A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. Pulse voltages of 2-7 V with a duration of 500 ns were applied to a CoNi/Pt multilayered film. Different types of Ir/Pt and W STM tips were used in the experiment. The results show that thermally recorded magnetic marks are formed with a nearly uniform mark size of 170 nm when the pulse voltage is above a threshold voltage. The threshold voltage depends on the material work function of the tip, with W having a threshold voltage about 1 V lower than Pt. The emission area of our tip-sample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. This emission area is large compared to lateral heat diffusion in the film. Thus higher applied voltages lead to higher peak temperatures in the model of the write process, but the mark diameter remains relatively unchanged.
Keywords
cobalt alloys; field emission; magnetic multilayers; nickel alloys; platinum alloys; scanning tunnelling microscopy; thermomagnetic recording; 1 to 7 V; 170 nm; CoNi-Pt; CoNi-Pt multilayered film; CoNi-Pt multilayers; Ir-Pt STM tip; W STM tip; field emission current; field emission voltage; heat-assisted magnetic probe recording; heat-assisted magnetic recording; high-density recording; lateral heat diffusion; mark diameter; mark size dependence; probe-based storage systems; prolate spheroidal coordinates; pulse voltages; scanning tunneling microscope; thermally recorded magnetic marks; threshold voltage; write process model; Heat-assisted magnetic recording; Heating; Magnetic films; Magnetic materials; Magnetic multilayers; Microscopy; Probes; Temperature; Threshold voltage; Tunneling; Field emission; high-density recording; prolate spheroidal coordinates; scanning tunneling microscope;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2004.830220
Filename
1325564
Link To Document