• DocumentCode
    107662
  • Title

    Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters

  • Author

    Sheng Zong ; Haoze Luo ; Wuhua Li ; Xiangning He ; Changliang Xia

  • Author_Institution
    Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
  • Volume
    62
  • Issue
    7
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    4170
  • Lastpage
    4180
  • Abstract
    This paper presents a digitally master-slave controlled parallel system of multiple LLC resonant converters with an inner resonant current control loop in each module. Theoretical analysis of the stability of individual modules and the system with an inner resonant current loop is proposed based on the envelop model, which reveals the principle of the performance improvement brought by the resonant current control loop. Moreover, the inner resonant current loop eliminates the differences in small-signal characteristics among different static operating points, thus facilitating the voltage loop design. The analysis of parallel operation and a complete control loop design guide for paralleled LLC resonant converters is presented based on a small-signal model rather than on software simulation. Finally, the stability analysis and design are elaborated and verified through a 16-kW experimental system of four modularized LLC resonant converters.
  • Keywords
    LC circuits; electric current control; resonant power convertors; stability; complete control loop design guide; digitally master-slave controlled parallel system; inner resonant current control loop; modularized LLC resonant converters; multiple LLC resonant converters; parallel operation; paralleled LLC resonant converters; power 16 kW; small-signal model; stability analysis; static operating points; voltage loop design; Admittance; Analytical models; Bandwidth; Stability criteria; Transfer functions; Voltage control; Envelope model; LLC resonant converter; envelope model; inner resonant current loop; parallel system stability; small-signal characteristics;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2014.2385661
  • Filename
    6995988