DocumentCode
1076702
Title
Pole-tip protrusion effect on high data rate recording performance
Author
Chekanov, Albert ; Weng, Robert ; Li, Fred ; Park, DongWon ; Yu, Mingjun
Author_Institution
MMC Technol., San Jose, CA, USA
Volume
40
Issue
4
fYear
2004
fDate
7/1/2004 12:00:00 AM
Firstpage
2591
Lastpage
2593
Abstract
Write pole-tip protrusion (PTP) effect on the overwrite performance at high recording data rate is discussed. It is shown that the head thermal expansion during the write process may lead to the degradation of overwrite value at high recording data rate. Overwrite degradation is caused by head-disk interactions when a high-frequency pattern is written. Appropriate selection of the disk lubricant can reduce the effect of the write PTP and increase the write current setting margin. At elevated drive temperatures, excessive PTP can cause head-disk interface failure. A write timing method allowing for the recording head to cool between the write cycles is proposed. A method of head-disk interface testing and a method of mapping the head-disk interactions are further described.
Keywords
magnetic heads; magnetic recording; thermal expansion; timing; PTP effect reduction; data recording rate; disk lubricant selection; head thermal expansion; head-disk interactions mapping; head-disk interface failure; head-disk interface testing; overwrite degradation; overwrite performance; overwrite value degradation; pole-tip protrusion effect; recording head cooling; write current setting margin; write thermal pole-tip protrusion; write timing method; Acoustic emission; Disk recording; Infrared heating; Magnetic heads; Magnetic recording; Manufacturing; Thermal degradation; Thermal expansion; Thermal stresses; Transistors; Head–disk interactions mapping; overwrite degradation; write thermal pole-tip protrusion;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2004.829826
Filename
1325578
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