DocumentCode :
1076702
Title :
Pole-tip protrusion effect on high data rate recording performance
Author :
Chekanov, Albert ; Weng, Robert ; Li, Fred ; Park, DongWon ; Yu, Mingjun
Author_Institution :
MMC Technol., San Jose, CA, USA
Volume :
40
Issue :
4
fYear :
2004
fDate :
7/1/2004 12:00:00 AM
Firstpage :
2591
Lastpage :
2593
Abstract :
Write pole-tip protrusion (PTP) effect on the overwrite performance at high recording data rate is discussed. It is shown that the head thermal expansion during the write process may lead to the degradation of overwrite value at high recording data rate. Overwrite degradation is caused by head-disk interactions when a high-frequency pattern is written. Appropriate selection of the disk lubricant can reduce the effect of the write PTP and increase the write current setting margin. At elevated drive temperatures, excessive PTP can cause head-disk interface failure. A write timing method allowing for the recording head to cool between the write cycles is proposed. A method of head-disk interface testing and a method of mapping the head-disk interactions are further described.
Keywords :
magnetic heads; magnetic recording; thermal expansion; timing; PTP effect reduction; data recording rate; disk lubricant selection; head thermal expansion; head-disk interactions mapping; head-disk interface failure; head-disk interface testing; overwrite degradation; overwrite performance; overwrite value degradation; pole-tip protrusion effect; recording head cooling; write current setting margin; write thermal pole-tip protrusion; write timing method; Acoustic emission; Disk recording; Infrared heating; Magnetic heads; Magnetic recording; Manufacturing; Thermal degradation; Thermal expansion; Thermal stresses; Transistors; Head–disk interactions mapping; overwrite degradation; write thermal pole-tip protrusion;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2004.829826
Filename :
1325578
Link To Document :
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