DocumentCode :
1076786
Title :
A method for experimental assessment of the shifting approximation, with application to polysilicon solar cells
Author :
Mazer, Jeffrey Alan ; Neugroschel, Arnost ; Lindholm, Fredrik A.
Author_Institution :
Harris Semiconductor, Inc., Palm Bay, FL
Volume :
28
Issue :
12
fYear :
1981
fDate :
12/1/1981 12:00:00 AM
Firstpage :
1530
Lastpage :
1534
Abstract :
A straightforward experimental method is developed for assessing the validity of the shifting approximation, I_{L}(V) = I_{SC}- I_{D}(V) , for polysilicon and other polycrystalline solar cells. The method uses the fact that, in a solar cell for which the shifting approximation is valid, a constant series resistance, independent of illumination, will cause the light and dark I-V curves to be symmetrically displaced with respect to the I_{SC}-V_{OC} curve. This symmetry is discussed in detail. The experimental data suggest that the shifting approximation is valid and the series resistance is independent of illumination up to at least one-sun intensity for a variety of polysilicon solar cells in which the intragrain-base minority carrier diffusion length is smaller than or equal to the average grain diameter.
Keywords :
Dark current; Equivalent circuits; Hall effect; Helium; Lighting; Nonlinear optics; Photoconductivity; Photovoltaic cells; Radiative recombination; Solar power generation;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20641
Filename :
1481793
Link To Document :
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