DocumentCode
1076964
Title
Ultrahigh-Speed 0.5 V Supply Voltage In0.7 Ga0.3As Quantum-Well Transistors on Silicon Substrate
Author
Datta, Suman ; Dewey, G. ; Fastenau, J.M. ; Hudait, M.K. ; Loubychev, D. ; Liu, W.K. ; Radosavljevic, M. ; Rachmady, W. ; Chau, R.
Author_Institution
Intel Corp., Hillsboro
Volume
28
Issue
8
fYear
2007
Firstpage
685
Lastpage
687
Abstract
The direct epitaxial growth of ultrahigh-mobility InGaAs/InAlAs quantum-well (QW) device layers onto silicon substrates using metamorphic buffer layers is demonstrated for the first time. In this letter, 80 nm physical gate length depletion-mode InGaAs QW transistors with saturated transconductance gm of 930 muS / mum and fT of 260 GHz at VDS = 0.5 V are achieved on 3.2 mum thick buffers. We expect that compound semiconductor-based advanced QW transistors could become available in the future as very high-speed and ultralow-power device technology for heterogeneous integration with the mainstream silicon CMOS.
Keywords
III-V semiconductors; buffer layers; elemental semiconductors; gallium arsenide; high electron mobility transistors; indium compounds; quantum well devices; semiconductor quantum wells; silicon; substrates; HEMT; In0.7Ga0.3As - Interface; Si - Surface; depletion-mode transistors; direct epitaxial growth; heterogeneous integration; metamorphic buffer layers; saturated transconductance; silicon substrate; size 80 nm; ultrahigh-mobility; ultrahigh-speed quantum-well transistors; voltage 0.5 V; Buffer layers; Epitaxial growth; Indium compounds; Indium gallium arsenide; Quantum well devices; Silicon; Substrates; Transconductance; Transistors; Voltage; Heterogeneous integration; III–V materials; InGaAs/InAlAs; low power; quantum-well (QW) devices; silicon;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2007.902078
Filename
4278355
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