DocumentCode
1077038
Title
Direct Electron-Beam Patterning of Teflon AF
Author
Karre, Vijayasree ; Keathley, Phillip D. ; Guo, Jing ; Hastings, Jeffery T.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Kentucky, Lexington, KY
Volume
8
Issue
2
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
139
Lastpage
141
Abstract
Teflon AF thin films have been directly patterned by electron-beam lithography without the need for chemical development. The pattern depth was found to be linearly related to exposure dose and increases with increasing film thickness. Features as small as 200 nm have been resolved. Fourier transform infrared measurements indicate that the electron-beam-induced patterning is related to degradation of the fluorinated dioxole group present in amorphous Teflon.
Keywords
Fourier transform spectra; electron beam lithography; infrared spectra; nanopatterning; optical polymers; polymer films; surface structure; Fourier transform infrared measurements; Teflon AF thin films; direct electron-beam patterning; electron-beam lithography; film thickness; fluorinated dioxole group degradation; fluoropolymers; pattern depth; size 200 nm; surface relief structures; Direct patterning; electron-beam lithography; fluoropolymers;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2009.2013137
Filename
4757288
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