• DocumentCode
    1077043
  • Title

    Near-threshold behavior of the intrinsic resonant frequency in a semiconductor laser

  • Author

    Paoli, Thomas L.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
  • Volume
    15
  • Issue
    8
  • fYear
    1979
  • fDate
    8/1/1979 12:00:00 AM
  • Firstpage
    807
  • Lastpage
    812
  • Abstract
    The excitation-dependence of the resonant frequency intrinsic to a semiconductor laser is analyzed in terms of a spatially uniform laser model which takes into account radiative and nonradiative recombination as well as spontaneous emission into the lasing modes. The analysis reveals that the frequency of the resonance excited by internal quantum noise approaches a minimum value as the excitation level approaches threshold in contradiction to the behavior expected from a small-signal analysis of the external modulation spectrum or the relaxation oscillations. This distinctly different behavior of the noise-excited resonance is shown to result from the presence of noise fluctuations in the optical field, which are sensed only by the noise-excited spectrum. Experimental observations made with a stripe-geometry (AlGa)As double-heterostructure laser confirm the predicted behavior of the noise-excited resonant frequency in the near-threshold regime.
  • Keywords
    Gallium materials/lasers; Semiconductor lasers; Laser excitation; Laser modes; Laser noise; Optical noise; Quantum well lasers; Radiative recombination; Resonance; Resonant frequency; Semiconductor device noise; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1979.1070077
  • Filename
    1070077