DocumentCode
1077043
Title
Near-threshold behavior of the intrinsic resonant frequency in a semiconductor laser
Author
Paoli, Thomas L.
Author_Institution
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Volume
15
Issue
8
fYear
1979
fDate
8/1/1979 12:00:00 AM
Firstpage
807
Lastpage
812
Abstract
The excitation-dependence of the resonant frequency intrinsic to a semiconductor laser is analyzed in terms of a spatially uniform laser model which takes into account radiative and nonradiative recombination as well as spontaneous emission into the lasing modes. The analysis reveals that the frequency of the resonance excited by internal quantum noise approaches a minimum value as the excitation level approaches threshold in contradiction to the behavior expected from a small-signal analysis of the external modulation spectrum or the relaxation oscillations. This distinctly different behavior of the noise-excited resonance is shown to result from the presence of noise fluctuations in the optical field, which are sensed only by the noise-excited spectrum. Experimental observations made with a stripe-geometry (AlGa)As double-heterostructure laser confirm the predicted behavior of the noise-excited resonant frequency in the near-threshold regime.
Keywords
Gallium materials/lasers; Semiconductor lasers; Laser excitation; Laser modes; Laser noise; Optical noise; Quantum well lasers; Radiative recombination; Resonance; Resonant frequency; Semiconductor device noise; Semiconductor lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1979.1070077
Filename
1070077
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